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Rigaku shows new products at IUCr 2008 in Osaka, Japan
 18 Aug 2008: Rigaku Americas Corporation is pleased to announce its attendance at the 21st annual International Union of Crystallography (IUCr) meeting in Osaka, Japan from August 23-31, 2008. Rigaku will be exhibiting its advanced lines of single crystal X-ray diffraction and crystallization automation instrumentation at Booth #C-01.
Rigaku Americas Corporation
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Bruker AXS Microanalysis Introduces Ultra-fast EBSD System, Next-Generation 123 eV Resolution XFlash® Silicon Drift Detectors and New Particle Analysis Software
 04 Aug 2008: At the Microscopy & Microanalysis 2008 Annual Meeting opening today, Bruker AXS Microanalysis introduces several new products and options for Scanning Electron Microscope (SEM) based materials analysis.
Bruker AXS Inc.
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CRISSY® - an automatic workbench for salt pre-screening and polymorph screening studies
 30 Jul 2008: Polymorphism affects a number of issues in pharmaceutical systems from processing characteristics and shelf life to bioavailability. To avoid "surprises" and secure potential product patents, polymorph screening is necessary at a very early stage in the drug discovery process. The solution is Zinsser Analytic`s CRISSY®, an automatic workbench for salt pre-screening and polymorph screening studies.
Zinsser Analytic GmbH
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Yale University chooses Rigaku X-ray diffraction (XRD) instruments for new chemistry instrumentation center
22 Jul 2008: Rigaku Americas Corporation today announced that the Department of Chemistry at Yale University has chosen two Rigaku X-ray diffraction (XRD) instruments to form the core of their new center for X-ray diffraction. Both the Rigaku RAPID II and Rigaku SCXmini™ diffractometers will be housed in a new facility within the Chemical Instrumentation Center at the Sterling Chemistry Laboratory.
Rigaku Americas Corporation
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Rigaku introduces the RAPID™ II curved detector X-ray diffraction (XRD) system
26 Jun 2008: Rigaku Americas Corporation today announced the introduction of a new, compact, fully integrated high-resolution X-ray diffraction system, the Rigaku RAPID II.
Rigaku Americas Corporation
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The Pittsburgh Conference Announces Pittcon® 2009 Call for Papers — August 15, 2008 Deadline
25 Jun 2008: The Pittsburgh Conference released the Call for Papers and the Call for Topics (Conferee Networking Sessions) for Pittcon 2009, the 60th annual Pittcon Conference and Exposition which will be held March 8—13, 2009, McCormick Place South, Chicago, Illinois.
The Pittsburgh Conference
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The Pittsburgh Conference Launches Pittcon® 2009 Website
 05 Jun 2008: The Pittsburgh Conference announces the launch of its 2009 website, www.pittcon.org, containing relevant information for conferees and exhibitors about Pittcon 2009 which will be in Chicago, Illinois, McCormick Place, March 8-13, 2009. The 2009 Pittcon website will be integral to the organization’s continuing plan of enhancing environmental awareness and going "green."
The Pittsburgh Conference
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ACHEMA 2009 shows commitment to global research and innovation
 27 May 2008: ACHEMA 2009 is underlining its commitment to supporting research and innovation worldwide by offering universities free exhibition booths within the event’s Research and Innovation area. This enables universities to exhibit their research skills and capabilities to 180 000 visitors from 100 countries.
Dechema
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9th Annual Drug Discovery Leaders Summit
08 May 2008: 9th Annual Drug Discovery Leaders Summit, 16 - 18 June 2008, Montreux Palace, Switzerland attracts 200 senior attendees from the UK, Europe and US’s leading pharmaceutical, biotech, academic and research institutions.
Oxford Global Conferences Ltd
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atomic abs / emission
19 Aug 2008: Andor Technology plc (Andor), a world leader in scientific imaging and spectroscopy solutions, today announced the launch of their new iKon-M X-ray camera. This extension to the established ‘iKon’ family of low light imaging cameras is designed to deliver high-performance solutions to direct detection X-ray needs, and is available in two variants: DO and DY.